Onto Innovation Inc.
ONTO Real Time Price USDRecent trades of ONTO by members of U.S. Congress
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Recently reported changes by institutional investors
Quarterly net insider trading by ONTO's directors and management
* Insider trading data parsed from SEC Form 4 filings by Quiver Quantitative. Sign up for the Quiver API for real-time access.
- 1M
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- 6M
- YTD
- 1Y
- 2Y
- 5Y
- MAX
About
Key Metrics
Return (1d)
Return (30d)
Return (1Y)
CAGR (Total)
Max Drawdown
Beta
Alpha
Sharpe Ratio
Win Rate
Average Win
Average Loss
Annual Volatility
Annual Std Dev
Information Ratio
Treynor Ratio
Total Trades
Metrics Definitions
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Alpha
Measures a portfolio's risk-adjusted performance against that of its benchmark
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Annual Standard Deviation
Measures how much the portfolio's total return varies from its mean or average.
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Annual Volatility
A statistical measure of the dispersion of returns for the portfolio.
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Average Win
The average return (%) for trades that resulted in a positive return.
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Average Loss
The average return (%) for trades that resulted in a negative return.
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Beta
A measure of the volatility of the portfolio compared to the market as a whole.
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CAGR
CAGR (Compounded Annual Growth Rate), is the historical annualized rate of return for an investment strategy, throughout the backtest period.
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Information Ratio
A measurement of portfolio returns beyond the returns of its benchmark compared to the volatility of those returns.
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Max Drawdown
the maximum observed loss from a peak to a trough of a portfolio, before a new peak is attained.
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Sharpe Ratio
The Sharpe Ratio is a measure of historical risk-adjusted return, which quantifies the amount of return that an investor received per unit of risk.
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Total Trades
The total number of trades made by this strategy.
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Treynor Ratio
Attempts to measure how successful an investment is in providing compensation to investors for taking on investment risk.
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Win Rate
The percentage of total trades that resulted in a positive return.
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Government lobbying spending instances
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$30,000 May 06, 2025 Issue: Trade (domestic/foreign) Science/Technology
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$30,000 Jan 23, 2025 Issue: Trade (domestic/foreign) Science/Technology
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$30,000 Oct 30, 2024 Issue: Science/Technology Trade (domestic/foreign)
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$30,000 Jul 18, 2024 Issue: Science/Technology Trade (domestic/foreign)
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$30,000 May 07, 2024 Issue: Science/Technology Trade (domestic/foreign)
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$30,000 Jan 22, 2024 Issue: Science/Technology Trade (domestic/foreign)
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$30,000 Oct 20, 2023 Issue: Science/Technology Trade (domestic/foreign)
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$30,000 Aug 02, 2023 Issue: Science/Technology Trade (domestic/foreign)
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$30,000 Feb 06, 2023 Issue: Science/Technology Trade (domestic/foreign)
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$30,000 Nov 11, 2022 Issue: Science/Technology Trade (domestic/foreign)
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$30,000 Aug 09, 2022 Issue: Science/Technology Trade (domestic/foreign)
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$30,000 Apr 26, 2022 Issue: Science/Technology Trade (domestic/foreign)
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$40,000 Jan 20, 2022 Issue: Science/Technology Trade (domestic/foreign)
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$30,000 Nov 04, 2021 Issue: Trade (domestic/foreign) Science/Technology
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$20,000 Jul 21, 2021 Issue: Trade (domestic/foreign) Science/Technology
Estimated quarterly lobbying spending
ONTO Revenue by Segment or Geography
New patents grants
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Patent Title: Mitigation of undesired spectral effects in optical metrology Mar. 25, 2025
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Patent Title: Area camera substrate pre-aligner Feb. 25, 2025
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Patent Title: Apparatus to characterize substrates and films Feb. 25, 2025
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Patent Title: Dynamic phase-shift interferometer utilizing a synchronous optical frequency-shift Feb. 04, 2025
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Patent Title: High resolution multispectral multi-field-of-view imaging system for wafer inspection Dec. 24, 2024
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Patent Title: Substrate mapping using deep neural-networks Oct. 29, 2024
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Patent Title: Semiconductor substrate yield prediction based on spectra data from multiple substrate dies Oct. 08, 2024
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Patent Title: Measurements of structures in presence of signal contaminations Sep. 17, 2024
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Patent Title: Non-destructive inspection and manufacturing metrology systems and methods Sep. 17, 2024
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Patent Title: Effective cell approximation model for logic structures Jun. 18, 2024
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Patent Title: Characterization of patterned structures using acoustic metrology May. 21, 2024
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Patent Title: Enhanced heat transfer in liquefied gas cooled detector Feb. 27, 2024
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Patent Title: Apparatus and method for multiple source excitation raman spectroscopy Jan. 16, 2024
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Patent Title: Wafer-level package assembly handling Nov. 07, 2023
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Patent Title: Target for optical measurement of trenches Nov. 07, 2023
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Patent Title: System and method for correcting overlay errors in a lithographic process Jun. 27, 2023
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Patent Title: Opto-acoustic measurement of a transparent film stack Jun. 06, 2023
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Patent Title: Wafer inspection system including a laser triangulation sensor Feb. 14, 2023
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Patent Title: System and method for optimizing a lithography exposure process Dec. 20, 2022
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Patent Title: Beamsplitter based ellipsometer focusing system Jul. 12, 2022
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Patent Title: Conformal stage Jun. 07, 2022
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Patent Title: Interferometry with pixelated color discriminating elements combined with pixelated polarization masks Jun. 07, 2022
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Patent Title: Focus system for oblique optical metrology device May. 31, 2022
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Patent Title: Fast generalized multi-wavelength ellipsometer May. 31, 2022
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Patent Title: Vortex polarimeter May. 31, 2022
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Patent Title: Wafer singulation process control Apr. 26, 2022
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Patent Title: Active damper for semiconductor metrology and inspection systems Mar. 22, 2022
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Patent Title: On-axis dynamic interferometer and optical imaging systems employing the same Mar. 01, 2022
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Patent Title: Optical metrology device using numerical aperture reduction Nov. 02, 2021
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Patent Title: Sample surface polarization modification in interferometric defect inspection Oct. 19, 2021
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Patent Title: System and method for optimizing a lithography exposure process Sep. 21, 2021
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Patent Title: Calibration of azimuth angle for optical metrology stage using grating-coupled surface plasmon resonance Aug. 03, 2021
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Patent Title: Sample inspection using topography Mar. 02, 2021
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Patent Title: Sub-resolution defect detection Mar. 02, 2021
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Patent Title: Non-adhesive mounting assembly for a tall rochon polarizer Feb. 09, 2021
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Patent Title: Optical metrology system using infrared wavelengths Jan. 26, 2021
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Patent Title: Interferometer with pixelated phase shift mask Nov. 10, 2020
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Patent Title: Foup purge shield Sep. 22, 2020
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Patent Title: Light source failure identification in an optical metrology device Sep. 15, 2020
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Patent Title: Optical metrology device for measuring samples having thin or thick films Aug. 18, 2020
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Patent Title: Surface height determination of transparent film Feb. 11, 2020
Federal grants, loans, and purchases
Estimated quarterly amount awarded from public contracts
Recent insights relating to ONTO
Recent picks made for ONTO stock on CNBC
ETFs with the largest estimated holdings in ONTO
- ... Highest Price Target
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- ... Lowest Price Target
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- Is $ONTO stock a Buy, Sell, or Hold?
- What is the price target for $ONTO stock?
* Analyst consensus is not financial advice. Please see our data disclaimers .
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Shareholder
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- Who owns $ONTO stock?
- Who owns the most shares of $ONTO stock?
- What funds own $ONTO stock?
* These are estimates based on data taken from SEC filings. There may be inaccuracies due to parsing errors, accidental double-counting, incorrect classification of indirectly owned shares, or any other number of issues.
The Quiver Smart Score combines our data on Congress Trading, Lobbying, Insider Trading, CNBC Mentions and more to provide a comprehensive view of the strength of a stock's underlying data.
The Smart Score grades stocks on a scale of 1 (weakest) to 10 (strongest) based on the strength of the underlying data.Sign Up to view ONTO Smart Score
See concise summaries of analyst reports, presenting both bullish and bearish arguments for a stock.
Example:
The Bulls Say summary highlights positive aspects of the stock.
The Bears Say summary points out potential risks and negative aspects of the stock.