Camtek Ltd
CAMT Real Time Price USDRecent trades of CAMT by members of U.S. Congress
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Recently reported changes by institutional investors
Quarterly net insider trading by CAMT's directors and management
* Insider trading data parsed from SEC Form 4 filings by Quiver Quantitative. Sign up for the Quiver API for real-time access.
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About
Key Metrics
Return (1d)
Return (30d)
Return (1Y)
CAGR (Total)
Max Drawdown
Beta
Alpha
Sharpe Ratio
Win Rate
Average Win
Average Loss
Annual Volatility
Annual Std Dev
Information Ratio
Treynor Ratio
Total Trades
Metrics Definitions
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Alpha
Measures a portfolio's risk-adjusted performance against that of its benchmark
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Annual Standard Deviation
Measures how much the portfolio's total return varies from its mean or average.
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Annual Volatility
A statistical measure of the dispersion of returns for the portfolio.
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Average Win
The average return (%) for trades that resulted in a positive return.
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Average Loss
The average return (%) for trades that resulted in a negative return.
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Beta
A measure of the volatility of the portfolio compared to the market as a whole.
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CAGR
CAGR (Compounded Annual Growth Rate), is the historical annualized rate of return for an investment strategy, throughout the backtest period.
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Information Ratio
A measurement of portfolio returns beyond the returns of its benchmark compared to the volatility of those returns.
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Max Drawdown
the maximum observed loss from a peak to a trough of a portfolio, before a new peak is attained.
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Sharpe Ratio
The Sharpe Ratio is a measure of historical risk-adjusted return, which quantifies the amount of return that an investor received per unit of risk.
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Total Trades
The total number of trades made by this strategy.
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Treynor Ratio
Attempts to measure how successful an investment is in providing compensation to investors for taking on investment risk.
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Win Rate
The percentage of total trades that resulted in a positive return.
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Government lobbying spending instances
Estimated quarterly lobbying spending
CAMT Revenue by Segment or Geography
New patents grants
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Patent Title: Method and system for classifying defects in wafer using wafer-defect images, based on deep learning Jun. 25, 2024
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Patent Title: Semiconductor edge and bevel inspection tool system Mar. 12, 2024
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Patent Title: Semiconductor inspection tool system and method for wafer edge inspection Nov. 28, 2023
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Patent Title: Measuring buried layers Jun. 20, 2023
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Patent Title: Automatic defect classification Apr. 12, 2022
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Patent Title: Optical contrast enhancement for defect inspection Jul. 06, 2021
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Patent Title: Defect detection Jun. 29, 2021
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Patent Title: Detection of pits using an automatic optical inspection system Apr. 27, 2021
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Patent Title: Inspecting an object that includes a photo-sensitive polyimide layer Nov. 03, 2020
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Patent Title: Height measurements of conductive structural elements that are surrounded by a photoresist layer Aug. 04, 2020
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Patent Title: Continuous light inspection Dec. 03, 2019
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Patent Title: Aperture stop Mar. 05, 2019
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Patent Title: System for inspecting a backside of a wafer Feb. 26, 2019
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Patent Title: Inspection system and a method for inspecting a diced wafer Feb. 12, 2019
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Patent Title: Method and system for low cost inspection Feb. 05, 2019
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Patent Title: Inspecting a wafer using image and design information Aug. 07, 2018
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Patent Title: Inspection system having an expanded angular coverage Jun. 05, 2018
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Patent Title: Optical inspection system using multi-facet imaging Jan. 02, 2018
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Patent Title: Selective vacuum printing machine Nov. 07, 2017
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Patent Title: High throughput triangulation system Sep. 12, 2017
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Patent Title: High throughput and low cost height triangulation system and method Sep. 05, 2017
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Patent Title: Adaptable end effector Sep. 05, 2017
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Patent Title: Selective solder mask printing on a printed circuit board (pcb) Aug. 01, 2017
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Patent Title: System and a method for solder mask inspection May. 23, 2017
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Patent Title: Multiple mode inspection system and method for evaluating a substrate by a multiple mode inspection system May. 02, 2017
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Patent Title: Method for improving coating Mar. 21, 2017
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Patent Title: System and a method for automatic recipe validation and selection Aug. 16, 2016
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Patent Title: Method and system for measuring bumps based on phase and amplitude information Sep. 29, 2015
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Patent Title: Advanced inspection method utilizing short pulses led illumination Aug. 04, 2015
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Patent Title: System and a method for inspecting an object using a hybrid sensor May. 26, 2015
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Patent Title: Process control and manufacturing method for fan out wafers Sep. 16, 2014
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Patent Title: Method and system for wafer registration May. 20, 2014
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Patent Title: Method and system for milling and imaging an object May. 13, 2014
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Patent Title: Inspection recipe generation and inspection based on an inspection recipe Apr. 15, 2014
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Patent Title: Chuck and a method for supporting an object Apr. 08, 2014
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Patent Title: Three dimensional inspection and metrology based on short pulses of light Mar. 25, 2014
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Patent Title: Multiple iteration substrate printing Mar. 25, 2014
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Patent Title: Method and system for controlling a manufacturing process Mar. 04, 2014
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Patent Title: Systems and methods for imaging multiple sides of objects Jan. 28, 2014
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Patent Title: Method and system for evaluating contact elements Nov. 05, 2013
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Patent Title: Wafer inspection system and a method for translating wafers Nov. 05, 2013
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Patent Title: System and a method for insepcting an object using a hybrid sensor Oct. 22, 2013
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Patent Title: Method and system for printing on a printed circuit board Sep. 17, 2013
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Patent Title: Advanced inspection method utilizing short pulses led illumination Aug. 27, 2013
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Patent Title: Device and method for inspecting an object Aug. 20, 2013
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Patent Title: Systems and methods for near infra-red optical inspection Jul. 23, 2013
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Patent Title: Method and system for inspecting beveled objects Jul. 02, 2013
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Patent Title: Dark field illuminator and a dark field illumination method Jul. 02, 2013
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Patent Title: System and method for height triangulation measurement Jan. 29, 2013
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Patent Title: System and a method for inspecting an object Jan. 22, 2013
Federal grants, loans, and purchases
Estimated quarterly amount awarded from public contracts
Recent insights relating to CAMT
Recent picks made for CAMT stock on CNBC
ETFs with the largest estimated holdings in CAMT
- ... Highest Price Target
- ... Median Price Target
- ... Lowest Price Target
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- Is $CAMT stock a Buy, Sell, or Hold?
- What is the price target for $CAMT stock?
* Analyst consensus is not financial advice. Please see our data disclaimers .
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Shareholder
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- Who owns $CAMT stock?
- Who owns the most shares of $CAMT stock?
- What funds own $CAMT stock?
* These are estimates based on data taken from SEC filings. There may be inaccuracies due to parsing errors, accidental double-counting, incorrect classification of indirectly owned shares, or any other number of issues.
The Quiver Smart Score combines our data on Congress Trading, Lobbying, Insider Trading, CNBC Mentions and more to provide a comprehensive view of the strength of a stock's underlying data.
The Smart Score grades stocks on a scale of 1 (weakest) to 10 (strongest) based on the strength of the underlying data.Sign Up to view CAMT Smart Score
See concise summaries of analyst reports, presenting both bullish and bearish arguments for a stock.
Example:
The Bulls Say summary highlights positive aspects of the stock.
The Bears Say summary points out potential risks and negative aspects of the stock.