Onto Innovation Inc.

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Overview
Financials
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Institutions
Government
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Income
Balance Sheet
Cash Flow
ONTO Income Statement
ONTO Balance Sheet
ONTO Cash Flow
Congress Trading

Recent trades of ONTO by members of U.S. Congress

Politician Type Traded
Tom Malinowski House / D Sale $1,001 - $15,000 May. 01, 2020
Tom Malinowski House / D Sale $1,001 - $15,000 Apr. 30, 2020
Tom Malinowski House / D Sale $1,001 - $15,000 Apr. 21, 2020
ONTO Stock Insider Trading Activity
Name
Type
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Price
Shares Held
Date
Reported
ONTO Stock Institutional Owners
Investor
Shares
Change in Shares
Market Value
Date
Reported
ONTO Derivatives Institutional Owners
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Change in Shares
Market Value
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Reported
Whale Activity

Recently reported changes by institutional investors

Insider Trading

Quarterly net insider trading by ONTO's directors and management

Corporate Lobbying

Government lobbying spending instances

  • $30,000 Oct 30, 2024 Issue: Science/Technology Trade (domestic/foreign)
  • $30,000 Jul 18, 2024 Issue: Science/Technology Trade (domestic/foreign)
  • $30,000 May 07, 2024 Issue: Science/Technology Trade (domestic/foreign)
  • $30,000 Jan 22, 2024 Issue: Science/Technology Trade (domestic/foreign)
  • $30,000 Oct 20, 2023 Issue: Science/Technology Trade (domestic/foreign)
  • $30,000 Aug 02, 2023 Issue: Science/Technology Trade (domestic/foreign)
  • $30,000 Feb 06, 2023 Issue: Science/Technology Trade (domestic/foreign)
  • $30,000 Nov 11, 2022 Issue: Science/Technology Trade (domestic/foreign)
  • $30,000 Aug 09, 2022 Issue: Science/Technology Trade (domestic/foreign)
  • $30,000 Apr 26, 2022 Issue: Science/Technology Trade (domestic/foreign)
  • $40,000 Jan 20, 2022 Issue: Science/Technology Trade (domestic/foreign)
  • $30,000 Nov 04, 2021 Issue: Trade (domestic/foreign) Science/Technology
  • $20,000 Jul 21, 2021 Issue: Trade (domestic/foreign) Science/Technology
Corporate Lobbying

Estimated quarterly lobbying spending

U.S. Patents

New patents grants

  • Patent Title: Substrate mapping using deep neural-networks Oct. 29, 2024
  • Patent Title: Semiconductor substrate yield prediction based on spectra data from multiple substrate dies Oct. 08, 2024
  • Patent Title: Measurements of structures in presence of signal contaminations Sep. 17, 2024
  • Patent Title: Non-destructive inspection and manufacturing metrology systems and methods Sep. 17, 2024
  • Patent Title: Effective cell approximation model for logic structures Jun. 18, 2024
  • Patent Title: Characterization of patterned structures using acoustic metrology May. 21, 2024
  • Patent Title: Enhanced heat transfer in liquefied gas cooled detector Feb. 27, 2024
  • Patent Title: Apparatus and method for multiple source excitation raman spectroscopy Jan. 16, 2024
  • Patent Title: Wafer-level package assembly handling Nov. 07, 2023
  • Patent Title: Target for optical measurement of trenches Nov. 07, 2023
  • Patent Title: System and method for correcting overlay errors in a lithographic process Jun. 27, 2023
  • Patent Title: Opto-acoustic measurement of a transparent film stack Jun. 06, 2023
  • Patent Title: Wafer inspection system including a laser triangulation sensor Feb. 14, 2023
  • Patent Title: System and method for optimizing a lithography exposure process Dec. 20, 2022
  • Patent Title: Beamsplitter based ellipsometer focusing system Jul. 12, 2022
  • Patent Title: Conformal stage Jun. 07, 2022
  • Patent Title: Interferometry with pixelated color discriminating elements combined with pixelated polarization masks Jun. 07, 2022
  • Patent Title: Focus system for oblique optical metrology device May. 31, 2022
  • Patent Title: Fast generalized multi-wavelength ellipsometer May. 31, 2022
  • Patent Title: Vortex polarimeter May. 31, 2022
  • Patent Title: Wafer singulation process control Apr. 26, 2022
  • Patent Title: Active damper for semiconductor metrology and inspection systems Mar. 22, 2022
  • Patent Title: On-axis dynamic interferometer and optical imaging systems employing the same Mar. 01, 2022
  • Patent Title: Optical metrology device using numerical aperture reduction Nov. 02, 2021
  • Patent Title: Sample surface polarization modification in interferometric defect inspection Oct. 19, 2021
  • Patent Title: System and method for optimizing a lithography exposure process Sep. 21, 2021
  • Patent Title: Calibration of azimuth angle for optical metrology stage using grating-coupled surface plasmon resonance Aug. 03, 2021
  • Patent Title: Sample inspection using topography Mar. 02, 2021
  • Patent Title: Sub-resolution defect detection Mar. 02, 2021
  • Patent Title: Non-adhesive mounting assembly for a tall rochon polarizer Feb. 09, 2021
  • Patent Title: Optical metrology system using infrared wavelengths Jan. 26, 2021
  • Patent Title: Interferometer with pixelated phase shift mask Nov. 10, 2020
  • Patent Title: Foup purge shield Sep. 22, 2020
  • Patent Title: Light source failure identification in an optical metrology device Sep. 15, 2020
  • Patent Title: Optical metrology device for measuring samples having thin or thick films Aug. 18, 2020
  • Patent Title: Surface height determination of transparent film Feb. 11, 2020
Government Contracts

Federal grants, loans, and purchases

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Government Contracts

Estimated quarterly amount awarded from public contracts

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WallStreetBets

Number of mentions of ONTO in WallStreetBets Daily Discussion

ONTO News

Recent insights relating to ONTO

CNBC Recommendations

Recent picks made for ONTO stock on CNBC

Top ETF Holders

ETFs with the largest estimated holdings in ONTO

ONTO Top Shareholders
Shareholder
Shares Held
ONTO Options Owners
Shareholder
Security
Underlying Shares

* These are estimates based on data taken from SEC filings. There may be inaccuracies due to parsing errors, accidental double-counting, incorrect classification of indirectly owned shares, or any other number of issues.

ONTO Stock Smart Score

The Quiver Smart Score combines our data on Congress Trading, Lobbying, Insider Trading, CNBC Mentions and more to provide a comprehensive view of the strength of a stock's underlying data.

The Smart Score grades stocks on a scale of 1 (weakest) to 10 (strongest) based on the strength of the underlying data.
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