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Camtek Ltd

CAMT

CAMT: Camtek Ltd is engaged in the manufacturing of metrology and inspection equipment and a provider of software solutions serving Advanced Packaging, Memory, (complementary metal oxide semiconductor) CMOS Image Sensors, (micro-electro mechanical systems) MEMS, RF, and others. Geographically, it derives maximum revenue from the Asia Pacific followed by the United States and Europe. The company products and services include Surface Inspection, Bump Inspection and Metrology, and others.

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  • Patent Title: Measuring buried layers Jun. 20, 2023
  • Patent Title: Automatic defect classification Apr. 12, 2022
  • Patent Title: Optical contrast enhancement for defect inspection Jul. 06, 2021
  • Patent Title: Defect detection Jun. 29, 2021
  • Patent Title: Detection of pits using an automatic optical inspection system Apr. 27, 2021
  • Patent Title: Inspecting an object that includes a photo-sensitive polyimide layer Nov. 03, 2020
  • Patent Title: Height measurements of conductive structural elements that are surrounded by a photoresist layer Aug. 04, 2020
  • Patent Title: Continuous light inspection Dec. 03, 2019
  • Patent Title: Aperture stop Mar. 05, 2019
  • Patent Title: System for inspecting a backside of a wafer Feb. 26, 2019
  • Patent Title: Inspection system and a method for inspecting a diced wafer Feb. 12, 2019
  • Patent Title: Method and system for low cost inspection Feb. 05, 2019
  • Patent Title: Inspecting a wafer using image and design information Aug. 07, 2018
  • Patent Title: Inspection system having an expanded angular coverage Jun. 05, 2018
  • Patent Title: Optical inspection system using multi-facet imaging Jan. 02, 2018
  • Patent Title: Selective vacuum printing machine Nov. 07, 2017
  • Patent Title: High throughput triangulation system Sep. 12, 2017
  • Patent Title: High throughput and low cost height triangulation system and method Sep. 05, 2017
  • Patent Title: Adaptable end effector Sep. 05, 2017
  • Patent Title: Selective solder mask printing on a printed circuit board (pcb) Aug. 01, 2017
  • Patent Title: System and a method for solder mask inspection May. 23, 2017
  • Patent Title: Multiple mode inspection system and method for evaluating a substrate by a multiple mode inspection system May. 02, 2017
  • Patent Title: Method for improving coating Mar. 21, 2017
  • Patent Title: System and a method for automatic recipe validation and selection Aug. 16, 2016
  • Patent Title: Method and system for measuring bumps based on phase and amplitude information Sep. 29, 2015
  • Patent Title: Advanced inspection method utilizing short pulses led illumination Aug. 04, 2015
  • Patent Title: System and a method for inspecting an object using a hybrid sensor May. 26, 2015
  • Patent Title: Process control and manufacturing method for fan out wafers Sep. 16, 2014
  • Patent Title: Method and system for wafer registration May. 20, 2014
  • Patent Title: Method and system for milling and imaging an object May. 13, 2014
  • Patent Title: Inspection recipe generation and inspection based on an inspection recipe Apr. 15, 2014
  • Patent Title: Chuck and a method for supporting an object Apr. 08, 2014
  • Patent Title: Three dimensional inspection and metrology based on short pulses of light Mar. 25, 2014
  • Patent Title: Multiple iteration substrate printing Mar. 25, 2014
  • Patent Title: Method and system for controlling a manufacturing process Mar. 04, 2014
  • Patent Title: Systems and methods for imaging multiple sides of objects Jan. 28, 2014
  • Patent Title: Method and system for evaluating contact elements Nov. 05, 2013
  • Patent Title: Wafer inspection system and a method for translating wafers Nov. 05, 2013
  • Patent Title: System and a method for insepcting an object using a hybrid sensor Oct. 22, 2013
  • Patent Title: Method and system for printing on a printed circuit board Sep. 17, 2013
  • Patent Title: Advanced inspection method utilizing short pulses led illumination Aug. 27, 2013
  • Patent Title: Device and method for inspecting an object Aug. 20, 2013
  • Patent Title: Systems and methods for near infra-red optical inspection Jul. 23, 2013
  • Patent Title: Method and system for inspecting beveled objects Jul. 02, 2013
  • Patent Title: Dark field illuminator and a dark field illumination method Jul. 02, 2013
  • Patent Title: System and method for height triangulation measurement Jan. 29, 2013
  • Patent Title: System and a method for inspecting an object Jan. 22, 2013
  • Patent Title: System and method for probe mark analysis Nov. 27, 2012
  • Patent Title: System and method for obtaining text Nov. 20, 2012
  • Patent Title: System and method for inspection Oct. 16, 2012
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