KLA Corporation Common Stock
KLAC Real Time Price USDRecent trades of KLAC by members of U.S. Congress
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Recently reported changes in KLAC holdings by institutional investors
Quarterly net insider trading by KLAC's directors and management
* Insider trading data parsed from SEC Form 4 filings by Quiver Quantitative. Sign up for the Quiver API for real-time access.
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- 5Y
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About
Key Metrics
Return (1d)
Return (30d)
Return (1Y)
CAGR (Total)
Max Drawdown
Beta
Alpha
Sharpe Ratio
Win Rate
Average Win
Average Loss
Annual Volatility
Annual Std Dev
Information Ratio
Treynor Ratio
Total Trades
Metrics Definitions
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Alpha
Measures a portfolio's risk-adjusted performance against that of its benchmark
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Annual Standard Deviation
Measures how much the portfolio's total return varies from its mean or average.
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Annual Volatility
A statistical measure of the dispersion of returns for the portfolio.
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Average Win
The average return (%) for trades that resulted in a positive return.
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Average Loss
The average return (%) for trades that resulted in a negative return.
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Beta
A measure of the volatility of the portfolio compared to the market as a whole.
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CAGR
CAGR (Compounded Annual Growth Rate), is the historical annualized rate of return for an investment strategy, throughout the backtest period.
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Information Ratio
A measurement of portfolio returns beyond the returns of its benchmark compared to the volatility of those returns.
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Max Drawdown
the maximum observed loss from a peak to a trough of a portfolio, before a new peak is attained.
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Sharpe Ratio
The Sharpe Ratio is a measure of historical risk-adjusted return, which quantifies the amount of return that an investor received per unit of risk.
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Total Trades
The total number of trades made by this strategy.
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Treynor Ratio
Attempts to measure how successful an investment is in providing compensation to investors for taking on investment risk.
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Win Rate
The percentage of total trades that resulted in a positive return.
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Government lobbying spending instances
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$270,000 Oct 20, 2025 Issue: Trade (domestic/foreign) Taxation/Internal Revenue Code
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$340,000 Jul 30, 2025 Issue: Taxation/Internal Revenue Code Trade (domestic/foreign)
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$320,000 Apr 21, 2025 Issue: Trade (domestic/foreign) Taxation/Internal Revenue Code
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$360,000 Jan 21, 2025 Issue: Trade (domestic/foreign) Taxation/Internal Revenue Code
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$450,000 Oct 21, 2024 Issue: Taxation/Internal Revenue Code Trade (domestic/foreign)
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$250,000 Jul 22, 2024 Issue: Taxation/Internal Revenue Code Trade (domestic/foreign)
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$320,000 Apr 22, 2024 Issue: Taxation/Internal Revenue Code Trade (domestic/foreign)
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$160,000 Jan 22, 2024 Issue: Taxation/Internal Revenue Code Trade (domestic/foreign)
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$90,000 Oct 20, 2023 Issue: Taxation/Internal Revenue Code Trade (domestic/foreign)
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$170,000 Jul 19, 2023 Issue: Taxation/Internal Revenue Code Trade (domestic/foreign)
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$240,000 Jan 19, 2023 Issue: Taxation/Internal Revenue Code Trade (domestic/foreign)
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$150,000 Oct 20, 2022 Issue: Taxation/Internal Revenue Code Trade (domestic/foreign)
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$180,000 Jul 19, 2022 Issue: Taxation/Internal Revenue Code Trade (domestic/foreign)
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$200,000 Apr 20, 2022 Issue: Taxation/Internal Revenue Code Trade (domestic/foreign)
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$180,000 Jan 20, 2022 Issue: None
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$120,000 Oct 19, 2021 Issue: None
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$180,000 Jul 20, 2021 Issue: None
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$240,000 Apr 20, 2021 Issue: None
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$120,000 Jan 21, 2021 Issue: None
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$130,000 Oct 22, 2020 Issue: None
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$150,000 Oct 22, 2020 Issue: None
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$150,000 Oct 22, 2020 Issue: None
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$50,000 Jan 21, 2020 Issue: Trade (domestic/foreign) Computer Industry
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$50,000 Oct 21, 2019 Issue: Trade (domestic/foreign) Computer Industry
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$50,000 Jul 21, 2019 Issue: Trade (domestic/foreign) Computer Industry
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$20,000 Apr 25, 2019 Issue: Trade (domestic/foreign) Computer Industry
KLAC Estimated quarterly lobbying spending
KLAC Revenue by Segment or Geography
New KLAC patent grants
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Patent Title: Cvd boron uniformity overcoming loading effects Nov. 25, 2025
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Patent Title: Single cell in-die metrology targets and measurement methods Nov. 25, 2025
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Patent Title: Detecting defects on specimens Nov. 25, 2025
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Patent Title: System and method for optimizing through silicon via overlay Nov. 25, 2025
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Patent Title: Optical and x-ray metrology methods for patterned semiconductor structures with randomness Nov. 25, 2025
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Patent Title: Deep learning based mode selection for inspection Nov. 25, 2025
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Patent Title: Automated focusing system for tracking specimen surface with a configurable focus offset Nov. 18, 2025
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Patent Title: Semiconductor measurements with robust in-line tool matching Nov. 18, 2025
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Patent Title: Systems and methods for uniform cooling of electromagnetic coil Nov. 04, 2025
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Patent Title: Measurement of thick films and high aspect ratio structures Nov. 04, 2025
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Patent Title: High-power compact vuv laser-sustained plasma light source Oct. 21, 2025
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Patent Title: Electron source with magnetic suppressor electrode Oct. 21, 2025
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Patent Title: Automatic method to find extent of repeating geometry in an integrated circuit layout Oct. 21, 2025
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Patent Title: Forward library based seeding for efficient x-ray scatterometry measurements Oct. 21, 2025
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Patent Title: Optics for measurement of thick films and high aspect ratio structures Oct. 21, 2025
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Patent Title: Asymmetric gas bearing bushing for thermo-pump Oct. 21, 2025
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Patent Title: Method and apparatus for positioning optical isolator assembly with replaceable motor assembly Oct. 14, 2025
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Patent Title: Single-material waveplates for pupil polarization filtering Oct. 14, 2025
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Patent Title: Image modeling-assisted contour extraction Oct. 14, 2025
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Patent Title: Rare event training data sets for robust training of semiconductor yield related components Oct. 14, 2025
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Patent Title: Robust image-to-design alignment for dram Oct. 14, 2025
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Patent Title: Quantitative linear independent vector based method (qlivbm) for image alignment Oct. 14, 2025
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Patent Title: Dynamic control of machine learning based measurement recipe optimization Oct. 14, 2025
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Patent Title: Imaging reflectometry for inline screening Sep. 23, 2025
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Patent Title: Scanning scatterometry overlay metrology Sep. 23, 2025
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Patent Title: Confocal chromatic metrology for euv source condition monitoring Sep. 16, 2025
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Patent Title: Methods and systems for selecting wafer locations to characterize cross-wafer variations based on high-throughput measurement signals Sep. 10, 2024
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Patent Title: Design-assisted large field of view metrology Sep. 10, 2024
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Patent Title: Wavelet system and method for ameliorating misregistration and asymmetry of semiconductor devices Sep. 03, 2024
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Patent Title: Machine learning using a global texture characteristic for semiconductor-based applications Sep. 03, 2024
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Patent Title: Universal metrology model Sep. 03, 2024
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Patent Title: Protective coating for nonlinear optical crystal Aug. 27, 2024
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Patent Title: Tilt-column multi-beam electron microscopy system and method Aug. 20, 2024
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Patent Title: Image pre-processing for overlay metrology using decomposition techniques Aug. 20, 2024
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Patent Title: Sensitivity improvement of optical and sem defection inspection Aug. 20, 2024
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Patent Title: Single grab overlay measurement of tall targets Aug. 20, 2024
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Patent Title: Characterization system and method with guided defect discovery Aug. 13, 2024
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Patent Title: Image contrast metrics for deriving and improving imaging conditions Aug. 06, 2024
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Patent Title: Training a machine learning model to generate higher resolution images from inspection images Jul. 30, 2024
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Patent Title: Vertical convolute metal bellows for rotary motion, vacuum sealing, and pressure sealing Jul. 23, 2024
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Patent Title: Dual vacuum seal Jul. 23, 2024
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Patent Title: Laser-sustained plasma source based on colliding liquid jets Jul. 09, 2024
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Patent Title: Imaging overlay with mutually coherent oblique illumination Jul. 09, 2024
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Patent Title: Soft x-ray optics with improved filtering Jul. 02, 2024
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Patent Title: Methods and systems for targeted monitoring of semiconductor measurement quality Jun. 25, 2024
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Patent Title: Back-illuminated sensor with boron layer deposited using plasma atomic layer deposition Jun. 18, 2024
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Patent Title: Multi-beam electronics scan Jun. 18, 2024
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Patent Title: Methods and systems for compact, small spot size soft x-ray scatterometry Jun. 18, 2024
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Patent Title: Electrostatic substrate cleaning system and method Jun. 11, 2024
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Patent Title: Enhancing performance of overlay metrology Jun. 04, 2024
Federal grants, loans, and purchases
Estimated quarterly amount awarded to KLAC from public contracts
Recent insights relating to KLAC
Recent picks made for KLAC stock on CNBC
ETFs with the largest estimated holdings in KLAC
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- Is $KLAC stock a Buy, Sell, or Hold?
- What is the price target for $KLAC stock?
* Analyst consensus is not financial advice. Please see our data disclaimers .
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- Who owns $KLAC stock?
- Who owns the most shares of $KLAC stock?
- What funds own $KLAC stock?
* These are estimates based on data taken from SEC filings. There may be inaccuracies due to parsing errors, accidental double-counting, incorrect classification of indirectly owned shares, or any other number of issues.
The Quiver Smart Score combines our data on Congress Trading, Lobbying, Insider Trading, CNBC Mentions and more to provide a comprehensive view of the strength of a stock's underlying data.
The Smart Score grades stocks on a scale of 1 (weakest) to 10 (strongest) based on the strength of the underlying data.Sign Up to view KLAC Smart Score
See concise summaries of analyst reports, presenting both bullish and bearish arguments for a stock.
Example:
The Bulls Say summary highlights positive aspects of the stock.
The Bears Say summary points out potential risks and negative aspects of the stock.
KLA is one of the largest semiconductor wafer fabrication equipment, or WFE, manufacturers in the world. It specializes in the market segment of semiconductor process control, wherein machines inspect semiconductor wafers during research and development and manufacturing for defects and verify precise measurements. In this section of the market, KLA holds a majority share. It also has a small exposure to the etch and deposition segments of the WFE market. It counts as top customers the largest chipmakers in the world, including TSMC and Samsung.
- Address Milpitas, CA
- Market Cap 154.4 billion
- Employees 15,200
- Industrial Classification Optical Instruments & Lenses