
KLA Corporation Common Stock
KLAC Real Time Price USDRecent trades of KLAC by members of U.S. Congress
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Recently reported changes by institutional investors
Quarterly net insider trading by KLAC's directors and management
Government lobbying spending instances
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$320,000 Apr 21, 2025 Issue: Trade (domestic/foreign) Taxation/Internal Revenue Code
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$360,000 Jan 21, 2025 Issue: Trade (domestic/foreign) Taxation/Internal Revenue Code
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$450,000 Oct 21, 2024 Issue: Taxation/Internal Revenue Code Trade (domestic/foreign)
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$250,000 Jul 22, 2024 Issue: Taxation/Internal Revenue Code Trade (domestic/foreign)
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$320,000 Apr 22, 2024 Issue: Taxation/Internal Revenue Code Trade (domestic/foreign)
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$160,000 Jan 22, 2024 Issue: Taxation/Internal Revenue Code Trade (domestic/foreign)
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$90,000 Oct 20, 2023 Issue: Taxation/Internal Revenue Code Trade (domestic/foreign)
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$170,000 Jul 19, 2023 Issue: Taxation/Internal Revenue Code Trade (domestic/foreign)
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$240,000 Jan 19, 2023 Issue: Taxation/Internal Revenue Code Trade (domestic/foreign)
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$150,000 Oct 20, 2022 Issue: Taxation/Internal Revenue Code Trade (domestic/foreign)
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$180,000 Jul 19, 2022 Issue: Taxation/Internal Revenue Code Trade (domestic/foreign)
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$200,000 Apr 20, 2022 Issue: Taxation/Internal Revenue Code Trade (domestic/foreign)
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$180,000 Jan 20, 2022 Issue: None
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$120,000 Oct 19, 2021 Issue: None
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$180,000 Jul 20, 2021 Issue: None
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$240,000 Apr 20, 2021 Issue: None
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$120,000 Jan 21, 2021 Issue: None
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$130,000 Oct 22, 2020 Issue: None
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$150,000 Oct 22, 2020 Issue: None
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$150,000 Oct 22, 2020 Issue: None
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$50,000 Jan 21, 2020 Issue: Trade (domestic/foreign) Computer Industry
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$50,000 Oct 21, 2019 Issue: Trade (domestic/foreign) Computer Industry
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$50,000 Jul 21, 2019 Issue: Trade (domestic/foreign) Computer Industry
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$20,000 Apr 25, 2019 Issue: Trade (domestic/foreign) Computer Industry
Estimated quarterly lobbying spending
KLAC Revenue by Segment or Geography
New patents grants
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Patent Title: Imaging overlay with mutually coherent oblique illumination Jul. 09, 2024
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Patent Title: Soft x-ray optics with improved filtering Jul. 02, 2024
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Patent Title: Methods and systems for targeted monitoring of semiconductor measurement quality Jun. 25, 2024
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Patent Title: Back-illuminated sensor with boron layer deposited using plasma atomic layer deposition Jun. 18, 2024
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Patent Title: Multi-beam electronics scan Jun. 18, 2024
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Patent Title: Methods and systems for compact, small spot size soft x-ray scatterometry Jun. 18, 2024
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Patent Title: Electrostatic substrate cleaning system and method Jun. 11, 2024
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Patent Title: Enhancing performance of overlay metrology Jun. 04, 2024
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Patent Title: Methods and systems for combining x-ray metrology data sets to improve parameter estimation May. 21, 2024
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Patent Title: Deep generative model-based alignment for semiconductor applications May. 14, 2024
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Patent Title: Substrate with cut semiconductor pieces having measurement test structures for semiconductor metrology May. 07, 2024
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Patent Title: Swirler for laser-sustained plasma light source with reverse vortex flow May. 07, 2024
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Patent Title: Optical etendue matching methods for extreme ultraviolet metrology Apr. 23, 2024
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Patent Title: On-product overlay targets Apr. 23, 2024
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Patent Title: Wafer level spatial signature grouping using transfer learning Apr. 23, 2024
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Patent Title: Semiconductor overlay measurements using machine learning Apr. 23, 2024
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Patent Title: System and method to adjust a kinetics model of surface reactions during plasma processing Apr. 23, 2024
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Patent Title: Lithography mask repair by simulation of photoresist thickness evolution Apr. 23, 2024
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Patent Title: Apparatus and method for gray field imaging Apr. 23, 2024
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Patent Title: Generative adversarial networks (gans) for simulating specimen images Apr. 16, 2024
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Patent Title: Water cooled, air bearing based rotating anode x-ray illumination source Apr. 09, 2024
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Patent Title: Method for measuring high resistivity test samples using voltages or resistances of spacings between contact probes Apr. 02, 2024
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Patent Title: Sensitive optical metrology in scanning and static modes Mar. 19, 2024
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Patent Title: Shielding strategy for mitigation of stray field for permanent magnet array Mar. 12, 2024
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Patent Title: Method of fabricating a high-pressure laser-sustained-plasma lamp Mar. 05, 2024
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Patent Title: Context-based defect inspection Mar. 05, 2024
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Patent Title: System and method for determining target feature focus in image-based overlay metrology Mar. 05, 2024
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Patent Title: System and method for pumping laser sustained plasma with an illumination source having modified pupil power distribution Mar. 05, 2024
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Patent Title: Inspection with previous step subtraction Mar. 05, 2024
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Patent Title: Overlay measurement targets design Feb. 27, 2024
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Patent Title: Optical metrology tool equipped with modulated illumination sources Feb. 27, 2024
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Patent Title: Automatic teaching of substrate handling for production and process-control tools Feb. 20, 2024
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Patent Title: Massive overlay metrology sampling with multiple measurement columns Feb. 13, 2024
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Patent Title: Deep ultraviolet laser using strontium tetraborate for frequency conversion Feb. 13, 2024
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Patent Title: System and method to weight defects with co-located modeled faults Feb. 13, 2024
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Patent Title: Detection and correction of system responses in real-time Feb. 06, 2024
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Patent Title: Apparatus, method and computer program product for defect detection in work pieces Feb. 06, 2024
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Patent Title: Laser-sustained plasma lamps with graded concentration of hydroxyl radical Jan. 30, 2024
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Patent Title: Setting up care areas for inspection of a specimen Jan. 30, 2024
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Patent Title: Electromagnet coils made from flexible circuits Jan. 23, 2024
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Patent Title: System and method for rendering sem images and predicting defect imaging conditions of substrates using 3d design Jan. 23, 2024
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Patent Title: Self-calibrating overlay metrology Jan. 23, 2024
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Patent Title: Method of measuring misregistration in the manufacture of topographic semiconductor device wafers Jan. 23, 2024
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Patent Title: Continuous degenerate elliptical retarder for sensitive particle detection Jan. 23, 2024
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Patent Title: Self-aligning vacuum feed-through for liquid nitrogen Jan. 23, 2024
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Patent Title: Verification metrology targets and their design Jan. 16, 2024
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Patent Title: Thick photo resist layer metrology target Jan. 16, 2024
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Patent Title: High throughput multi-electron beam system Jan. 09, 2024
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Patent Title: Systems and methods for setting up a physics-based model Jan. 09, 2024
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Patent Title: Multiple-tool parameter set calibration and misregistration measurement system and method Jan. 02, 2024
Federal grants, loans, and purchases
Estimated quarterly amount awarded from public contracts
Recent insights relating to KLAC
Recent picks made for KLAC stock on CNBC
ETFs with the largest estimated holdings in KLAC
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Analyst
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- Is $KLAC stock a Buy, Sell, or Hold?
- What is the price target for $KLAC stock?
* Analyst consensus is not financial advice. Please see our data disclaimers .
Shareholder
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- Who owns $KLAC stock?
- Who owns the most shares of $KLAC stock?
- What funds own $KLAC stock?
* These are estimates based on data taken from SEC filings. There may be inaccuracies due to parsing errors, accidental double-counting, incorrect classification of indirectly owned shares, or any other number of issues.
The Quiver Smart Score combines our data on Congress Trading, Lobbying, Insider Trading, CNBC Mentions and more to provide a comprehensive view of the strength of a stock's underlying data.
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