FormFactor Inc.

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U.S. Patents

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  • Patent Title: Beamforming device testing Oct. 08, 2024
  • Patent Title: Method of centering probe head in mounting frame Jul. 23, 2024
  • Patent Title: Probes that define retroreflectors, probe systems that include the probes, and methods of utilizing the probes Mar. 12, 2024
  • Patent Title: Probe systems including imaging devices with objective lens isolators, and related methods Jan. 16, 2024
  • Patent Title: Methods of producing augmented probe system images and associated probe systems Nov. 21, 2023
  • Patent Title: Method and device for optically representing electronic semiconductor components Sep. 12, 2023
  • Patent Title: 3d electrical integration using component carrier edge connections to a 2d contact array Apr. 11, 2023
  • Patent Title: Probe systems configured to test a device under test and methods of operating the probe systems Mar. 07, 2023
  • Patent Title: Multi-conductor transmission line probe Nov. 01, 2022
  • Patent Title: Direct metalized guide plate Oct. 04, 2022
  • Patent Title: Microscopes with objective assembly crash detection and methods of utiliizing the same Sep. 27, 2022
  • Patent Title: Double-sided probe systems with thermal control systems and related methods Jul. 05, 2022
  • Patent Title: Probe systems and methods for testing a device under test May. 31, 2022
  • Patent Title: Probe systems and methods for characterizing optical coupling between an optical probe of a probe system and a calibration structure Apr. 26, 2022
  • Patent Title: Probe on carrier architecture for vertical probe arrays Apr. 05, 2022
  • Patent Title: Methods for maintaining gap spacing between an optical probe of a probe system and an optical device of a device under test, and probe systems that perform the methods Dec. 21, 2021
  • Patent Title: Mems probe card assembly having decoupled electrical and mechanical probe connections Oct. 26, 2021
  • Patent Title: Electrical test probes having decoupled electrical and mechanical design Oct. 26, 2021
  • Patent Title: Probe systems for optically probing a device under test and methods of operating the probe systems Sep. 28, 2021
  • Patent Title: Probe tip with embedded skate Jul. 06, 2021
  • Patent Title: Probe systems and methods Jun. 29, 2021
  • Patent Title: Calibration chucks for optical probe systems, optical probe systems including the calibration chucks, and methods of utilizing the optical probe systems Jun. 29, 2021
  • Patent Title: Methods of controlling the operation of probe stations and probe stations that perform the methods, the methods including generating and executing a test routine that directs the probe station to electrically test a test subset of a plurality of duts and to pre-test a pre-test subset of a plurality of duts, which is a subset of the test subset, with a pre-test May. 25, 2021
  • Patent Title: Vertical probe array having a tiled membrane space transformer Mar. 03, 2020
  • Patent Title: Probe head with inductance reducing structure Jan. 07, 2020
  • Patent Title: Probes with spring mechanisms for impeding unwanted movement in guide holes Jul. 23, 2019
  • Patent Title: Led light source probe card technology for testing cmos image scan devices Jul. 16, 2019
  • Patent Title: Contactor devices with carbon nanotube probes embedded in a flexible film and processes of making such Apr. 23, 2019
  • Patent Title: Multipath electrical probe and probe assemblies with signal paths through secondary paths between electrically conductive guide plates Nov. 20, 2018
  • Patent Title: Probes with programmable motion Jun. 26, 2018
  • Patent Title: Floating nest for a test socket May. 01, 2018
  • Patent Title: Wiring substrate with filled vias to accommodate custom terminals Jan. 16, 2018
  • Patent Title: Non-linear vertical leaf spring Jul. 11, 2017
  • Patent Title: Automated attaching and detaching of an interchangeable probe head Jun. 27, 2017
  • Patent Title: Probe card assembly for testing electronic devices Mar. 07, 2017
  • Patent Title: Wiring substrate with filled vias to accommodate custom terminals Dec. 20, 2016
  • Patent Title: Multiple contact probes Apr. 19, 2016
  • Patent Title: Probe retention arrangement Apr. 12, 2016
  • Patent Title: Vertical probe array arranged to provide space transformation Mar. 01, 2016
  • Patent Title: Hybrid electrical contactor Jan. 05, 2016
  • Patent Title: Probes with offset arm and suspension structure Sep. 01, 2015
  • Patent Title: Layered probes with core Aug. 04, 2015
  • Patent Title: Attachment of an electrical element to an electronic device using a conductive material Jul. 14, 2015
  • Patent Title: Probe with cantilevered beam having solid and hollow sections Jun. 09, 2015
  • Patent Title: Wireless probe card verification system and method May. 19, 2015
  • Patent Title: Sharpened, oriented contact tip structures May. 12, 2015
  • Patent Title: Testing techniques for through-device vias Nov. 25, 2014
  • Patent Title: Method and apparatus for testing devices using serially controlled intelligent switches Oct. 28, 2014
  • Patent Title: Wafer test cassette system Oct. 28, 2014
  • Patent Title: Elastic encapsulated carbon nanotube based electrical contacts Oct. 28, 2014
Government Contracts

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WallStreetBets

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