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Aehr Test Systems

AEHR

AEHR: Aehr Test Systems is engaged in test systems for burning-in and testing logic, optical, and memory integrated circuits. Increased quality and reliability needs of the Automotive and Mobility integrated circuit markets are driving additional test requirements, incremental capacity needs, and new opportunities for the company's products in package, wafer level, and singulated die/module level test. The company provides production solutions across the product manufacturing flow to improve yield and reliability and has developed and introduced several innovative products, including the ABTSTM and FOX-PTM families of test and burn-in systems and FOX WaferPakTM Aligner, FOX-XP WaferPak Contactor, FOX DiePak Carrier and FOX DiePak Loader.

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  • Patent Title: Electronics tester Apr. 25, 2023
  • Patent Title: Pressure relief valve Feb. 28, 2023
  • Patent Title: System for testing an integrated circuit of a device and its method of use Sep. 20, 2022
  • Patent Title: Apparatus for testing electronic devices Feb. 22, 2022
  • Patent Title: Method and system for thermal control of devices in an electronics tester Dec. 28, 2021
  • Patent Title: Electronics tester Dec. 14, 2021
  • Patent Title: Pressure relief valve Sep. 07, 2021
  • Patent Title: Electronics tester with power saving state Apr. 13, 2021
  • Patent Title: Apparatus for testing electronic devices Dec. 01, 2020
  • Patent Title: Electronics tester with current amplification Jul. 21, 2020
  • Patent Title: System for testing an integrated circuit of a device and its method of use Jun. 09, 2020
  • Patent Title: Electronics tester May. 12, 2020
  • Patent Title: Layout of contacts Feb. 18, 2020
  • Patent Title: Electronics tester with output circuits operable in voltage compensated power mode, driver mode or current compensated power mode Nov. 26, 2019
  • Patent Title: Method and system for thermal control of devices in an electronics tester Nov. 05, 2019
  • Patent Title: Limiting translation for consistent substrate-to-substrate contact Sep. 03, 2019
  • Patent Title: Layout of contacts Jun. 04, 2019
  • Patent Title: Electronics tester with double-spiral thermal control passage in a thermal chuck Dec. 11, 2018
  • Patent Title: Apparatus for testing electronic devices Oct. 09, 2018
  • Patent Title: Controlling alignment during a thermal cycle Jan. 30, 2018
  • Patent Title: Electronics tester with output circuits operable in voltage compensated power mode, driver mode or current compensated power mode Jan. 23, 2018
  • Patent Title: Electronics tester with group and individual current configurations Jan. 02, 2018
  • Patent Title: Controlling alignment during a thermal cycle Apr. 18, 2017
  • Patent Title: Electronics tester with hot fluid thermal control Nov. 22, 2016
  • Patent Title: Apparatus for testing electronic devices Apr. 19, 2016
  • Patent Title: Electronics tester with a valve integrally formed in a component of a portable pack Mar. 22, 2016
  • Patent Title: System for testing an integrated circuit of a device and its method of use Feb. 02, 2016
  • Patent Title: Apparatus for testing electronic devices Oct. 06, 2015
  • Patent Title: Adhesively attached stand-offs on a portable pack for an electronics tester Jul. 21, 2015
  • Patent Title: Integrated feedthrough module Mar. 24, 2015
  • Patent Title: System for testing an integrated circuit of a device and its method of use Feb. 03, 2015
  • Patent Title: Apparatus for testing electronic devices Jun. 10, 2014
  • Patent Title: Apparatus for testing electronic devices Jan. 14, 2014
  • Patent Title: Apparatus for testing electronic devices Mar. 05, 2013
  • Patent Title: System for testing an integrated circuit of a device and its method of use Jul. 24, 2012
  • Patent Title: Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion Jun. 12, 2012
  • Patent Title: Apparatus for testing electronic devices Feb. 21, 2012
  • Patent Title: System for testing an integrated circuit of a device and its method of use Oct. 04, 2011
  • Patent Title: Separate test electronics and blower modules in an apparatus for testing an integrated circuit Jun. 28, 2011
  • Patent Title: Wafer level burn-in and electrical test system and method Apr. 19, 2011
  • Patent Title: Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion Mar. 08, 2011
  • Patent Title: Interface on an electronics connector Dec. 28, 2010
  • Patent Title: Apparatus for testing electronic devices Nov. 02, 2010
  • Patent Title: Apparatus for testing electronic devices Jul. 27, 2010
  • Patent Title: Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion Feb. 23, 2010
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